SFB 1270 ELAINE
12 June 2018 - Sebastian Runde et al.
The most important results of the publication were also summarized in "Advances in Engineering".
P. Nestler, C.A. Helm, Determination of refractive index and layer thickness of nm-thin films via ellipsometry, Opt. Express 25, 27077-27085 (2017), also highlighted as Spotlight on Optics by The Optical Society
Stefanie Perfahl, Marta M. Natile, Heba S. Mohamad, Christiane A. Helm, Carola Schulzke, Giovanni Natile, and Patrick J. Bednarski